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Control-Enhanced Quantum Metrology Guided by Pontryagin's Minimum Principle

Shouliang Hu, Hailan Ma, Yunyan Lee, Daoyi Dong, Ian R. Petersen. Control-Enhanced Quantum Metrology Guided by Pontryagin's Minimum Principle. In 64th IEEE Conference on Decision and Control, CDC 2025, Rio de Janeiro, Brazil, December 9-12, 2025. pages 6724-6729, IEEE, 2025. [doi]

Authors

Shouliang Hu

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Hailan Ma

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Yunyan Lee

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Daoyi Dong

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Ian R. Petersen

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