Wei Hu, Hongyu Qi, Zhenbing Zhao, Leilei Xu. A Method for Detecting Surface Defects in Insulators Based on RPCA. In Yao Zhao, Xiangwei Kong, David Taubman, editors, Image and Graphics - 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part II. Volume 10667 of Lecture Notes in Computer Science, pages 163-173, Springer, 2017. [doi]
Abstract is missing.