Weiming Hu, Nianhua Xie, Ruiguang Hu, Haibin Ling, Qiang Chen, Shuicheng Yan, Stephen J. Maybank. Bin Ratio-Based Histogram Distances and Their Application to Image Classification. IEEE Trans. Pattern Anal. Mach. Intell., 36(12):2338-2352, 2014. [doi]
Abstract is missing.