Study on Generalized Analysis Model for Fringe Pattern Profilometry

Yingsong Hu, Jiangtao Xi, Zongkai Yang, Enbang Li, Joe F. Chicharo. Study on Generalized Analysis Model for Fringe Pattern Profilometry. IEEE T. Instrumentation and Measurement, 57(1):160-167, 2008. [doi]

Abstract

Abstract is missing.