Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software

Yuqi Huai, Yuntianyi Chen, Sumaya Almanee, Tuan Ngo, Xiang Liao, Ziwen Wan, Qi Alfred Chen, Joshua Garcia. Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 2591-2603, IEEE, 2023. [doi]

Authors

Yuqi Huai

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Yuntianyi Chen

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Sumaya Almanee

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Tuan Ngo

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Xiang Liao

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Ziwen Wan

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Qi Alfred Chen

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Joshua Garcia

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