Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software

Yuqi Huai, Yuntianyi Chen, Sumaya Almanee, Tuan Ngo, Xiang Liao, Ziwen Wan, Qi Alfred Chen, Joshua Garcia. Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 2591-2603, IEEE, 2023. [doi]

@inproceedings{HuaiCANLWCG23,
  title = {Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software},
  author = {Yuqi Huai and Yuntianyi Chen and Sumaya Almanee and Tuan Ngo and Xiang Liao and Ziwen Wan and Qi Alfred Chen and Joshua Garcia},
  year = {2023},
  doi = {10.1109/ICSE48619.2023.00216},
  url = {https://doi.org/10.1109/ICSE48619.2023.00216},
  researchr = {https://researchr.org/publication/HuaiCANLWCG23},
  cites = {0},
  citedby = {0},
  pages = {2591-2603},
  booktitle = {45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023},
  publisher = {IEEE},
  isbn = {978-1-6654-5701-9},
}