Yu Huang. Innovative practices session 11C SoC testing. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1, IEEE, 2017. [doi]
@inproceedings{Huang17-18, title = {Innovative practices session 11C SoC testing}, author = {Yu Huang}, year = {2017}, doi = {10.1109/VTS.2017.7928962}, url = {https://doi.org/10.1109/VTS.2017.7928962}, researchr = {https://researchr.org/publication/Huang17-18}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017}, publisher = {IEEE}, isbn = {978-1-5090-4482-5}, }