Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yiming Ouyang, Tianming Ni, Zhenmin Li. Design of node separated triple-node-upset self-recoverable latch. Microelectronics Journal, 114:105111, 2021. [doi]
@article{HuangCCLLONL21,
title = {Design of node separated triple-node-upset self-recoverable latch},
author = {Zhengfeng Huang and Di Cao and Jianguo Cui and Yingchun Lu and Huaguo Liang and Yiming Ouyang and Tianming Ni and Zhenmin Li},
year = {2021},
doi = {10.1016/j.mejo.2021.105111},
url = {https://doi.org/10.1016/j.mejo.2021.105111},
researchr = {https://researchr.org/publication/HuangCCLLONL21},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {114},
pages = {105111},
}