Hou-Kuei Huang, Cieh-Pin Chang, Mau-Phon Houng, Yeong-Her Wang. Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs. Microelectronics Reliability, 46(12):2038-2043, 2006. [doi]
@article{HuangCHW06,
title = {Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs},
author = {Hou-Kuei Huang and Cieh-Pin Chang and Mau-Phon Houng and Yeong-Her Wang},
year = {2006},
doi = {10.1016/j.microrel.2006.02.014},
url = {http://dx.doi.org/10.1016/j.microrel.2006.02.014},
researchr = {https://researchr.org/publication/HuangCHW06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {12},
pages = {2038-2043},
}