Parameters extraction on HfOX based RRAM

Peng Huang, Bing Chen, Haitong Li, Zhe Chen, Bin Gao, Xiaoyan Liu, JinFeng Kang. Parameters extraction on HfOX based RRAM. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 250-253, IEEE, 2014. [doi]

@inproceedings{HuangCLCGLK14,
  title = {Parameters extraction on HfOX based RRAM},
  author = {Peng Huang and Bing Chen and Haitong Li and Zhe Chen and Bin Gao and Xiaoyan Liu and JinFeng Kang},
  year = {2014},
  doi = {10.1109/ESSDERC.2014.6948807},
  url = {http://dx.doi.org/10.1109/ESSDERC.2014.6948807},
  researchr = {https://researchr.org/publication/HuangCLCGLK14},
  cites = {0},
  citedby = {0},
  pages = {250-253},
  booktitle = {44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-4378-4},
}