Ke Huang, John M. Carulli Jr., Yiorgos Makris. Parametric counterfeit IC detection via Support Vector Machines. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 7-12, IEEE Computer Society, 2012. [doi]
@inproceedings{HuangCM12-1,
title = {Parametric counterfeit IC detection via Support Vector Machines},
author = {Ke Huang and John M. Carulli Jr. and Yiorgos Makris},
year = {2012},
doi = {10.1109/DFT.2012.6378191},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2012.6378191},
researchr = {https://researchr.org/publication/HuangCM12-1},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3043-5},
}