Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver

Tsung-Ching Huang, Kwang-Ting (Tim) Cheng, Huai-Yuan Tseng, Chen-Pang Kung. Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. JETC, 4(3), 2008. [doi]

Authors

Tsung-Ching Huang

This author has not been identified. Look up 'Tsung-Ching Huang' in Google

Kwang-Ting (Tim) Cheng

This author has not been identified. Look up 'Kwang-Ting (Tim) Cheng' in Google

Huai-Yuan Tseng

This author has not been identified. Look up 'Huai-Yuan Tseng' in Google

Chen-Pang Kung

This author has not been identified. Look up 'Chen-Pang Kung' in Google