Ling Huang, Deruo Cheng, XuLei Yang, Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah-Hwee Gwee, Bihan Wen. Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 3497-3501, IEEE, 2021. [doi]
@inproceedings{HuangCYLSYGW21,
title = {Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning},
author = {Ling Huang and Deruo Cheng and XuLei Yang and Tong Lin and Yiqiong Shi and Kaiyi Yang and Bah-Hwee Gwee and Bihan Wen},
year = {2021},
doi = {10.1109/ICIP42928.2021.9506454},
url = {https://doi.org/10.1109/ICIP42928.2021.9506454},
researchr = {https://researchr.org/publication/HuangCYLSYGW21},
cites = {0},
citedby = {0},
pages = {3497-3501},
booktitle = {2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4115-5},
}