Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology

Guo-Lun Huang, Wei-Hao Fu, Chun-Yu Lin. Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. Microelectronics Reliability, 83:271-280, 2018. [doi]

Authors

Guo-Lun Huang

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Wei-Hao Fu

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Chun-Yu Lin

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