Guo-Lun Huang, Wei-Hao Fu, Chun-Yu Lin. Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. Microelectronics Reliability, 83:271-280, 2018. [doi]
@article{HuangFL18,
title = {Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology},
author = {Guo-Lun Huang and Wei-Hao Fu and Chun-Yu Lin},
year = {2018},
doi = {10.1016/j.microrel.2017.06.068},
url = {https://doi.org/10.1016/j.microrel.2017.06.068},
researchr = {https://researchr.org/publication/HuangFL18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {83},
pages = {271-280},
}