Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

Jianlin Huang, Dusan S. Golubovic, Sau Koh, Dao-Guo Yang, Xiupeng Li, Xuejun Fan, G. Q. Zhang. Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests. Microelectronics Reliability, 55(12):2654-2662, 2015. [doi]

Abstract

Abstract is missing.