Fault-avoidance C-element based low overhead and TNU-resilient latch

Zhengfeng Huang, Zhouyu Gong, Dongxing Ma, Xiaolei Wang, Yingchun Lu, Wenfa Zhan, Huaguo Liang, Tianming Ni. Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectronics Journal, 131:105650, 2023. [doi]

@article{HuangGMWLZLN23,
  title = {Fault-avoidance C-element based low overhead and TNU-resilient latch},
  author = {Zhengfeng Huang and Zhouyu Gong and Dongxing Ma and Xiaolei Wang and Yingchun Lu and Wenfa Zhan and Huaguo Liang and Tianming Ni},
  year = {2023},
  doi = {10.1016/j.mejo.2022.105650},
  url = {https://doi.org/10.1016/j.mejo.2022.105650},
  researchr = {https://researchr.org/publication/HuangGMWLZLN23},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {131},
  pages = {105650},
}