Uncertainty-Guided Test-Time Training for Face Forgery Detection

Shenyuan Huang, Huaibo Huang, Zi Wang, Nan Xu, Aihua Zheng, Ran He. Uncertainty-Guided Test-Time Training for Face Forgery Detection. In Huimin Lu 0001, Michael Blumenstein, Sung-Bae Cho, Cheng-Lin Liu, Yasushi Yagi, Tohru Kamiya, editors, Pattern Recognition - 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part II. Volume 14407 of Lecture Notes in Computer Science, pages 258-272, Springer, 2023. [doi]

Abstract

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