Reduction of power consumption in scan-based circuits during testapplication by an input control technique

Tsung-Chu Huang, Kuen-Jong Lee. Reduction of power consumption in scan-based circuits during testapplication by an input control technique. IEEE Trans. on CAD of Integrated Circuits and Systems, 20(7):911-917, 2001. [doi]

@article{HuangL01:0,
  title = {Reduction of power consumption in scan-based circuits during testapplication by an input control technique},
  author = {Tsung-Chu Huang and Kuen-Jong Lee},
  year = {2001},
  doi = {10.1109/43.931040},
  url = {http://doi.ieeecomputersociety.org/10.1109/43.931040},
  tags = {power consumption, rule-based},
  researchr = {https://researchr.org/publication/HuangL01%3A0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {20},
  number = {7},
  pages = {911-917},
}