Wen-Cong Huang, I-Ting Lin, Wen-Ching Chen, Liang-Yi Lin, Nian-Shyang Chang, Chun-Pin Lin, Chi-Shi Chen, Chia-Hsiang Yang. A 28-nm 25.1 TOPS/W Sparsity-Aware CNN-GCN Deep Learning SoC for Mobile Augmented Reality. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 42-43, IEEE, 2022. [doi]
@inproceedings{HuangLCLCLCY22,
title = {A 28-nm 25.1 TOPS/W Sparsity-Aware CNN-GCN Deep Learning SoC for Mobile Augmented Reality},
author = {Wen-Cong Huang and I-Ting Lin and Wen-Ching Chen and Liang-Yi Lin and Nian-Shyang Chang and Chun-Pin Lin and Chi-Shi Chen and Chia-Hsiang Yang},
year = {2022},
doi = {10.1109/VLSITechnologyandCir46769.2022.9830261},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830261},
researchr = {https://researchr.org/publication/HuangLCLCLCY22},
cites = {0},
citedby = {0},
pages = {42-43},
booktitle = {IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9772-5},
}