A novel metric for quantitatively measuring memory effects in OOFDM system - researchr publication authors

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Muyu Huang, Jun Li, Hao He, Meihua Bi, Shilin Xiao, Weisheng Hu. A novel metric for quantitatively measuring memory effects in OOFDM system. In 22nd Wireless and Optical Communication Conference, WOCC 2013, Chongqing, China, May 16-18, 2013. pages 546-548, IEEE, 2013. [doi]

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