A novel metric for quantitatively measuring memory effects in OOFDM system

Muyu Huang, Jun Li, Hao He, Meihua Bi, Shilin Xiao, Weisheng Hu. A novel metric for quantitatively measuring memory effects in OOFDM system. In 22nd Wireless and Optical Communication Conference, WOCC 2013, Chongqing, China, May 16-18, 2013. pages 546-548, IEEE, 2013. [doi]

Abstract

Abstract is missing.