Shao-Chang Huang, Chih-Cherng Liao, Hsien-Feng Liao, Shou-Peng Weng, Karuna Nidhi, Yu-Kai Wang, Yi-Jen Chen, Hwa-Chyi Chiou, Yeh-Ning Jou, Jian-Hsing Lee. Analyzing Gate-Driven Circuit Parameters for Adding ESD Performances. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019, Yilan, Taiwan, May 20-22, 2019. pages 1-2, IEEE, 2019. [doi]
Abstract is missing.