Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng. At-speed BIST for interposer wires supporting on-the-spot diagnosis. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 67-72, IEEE, 2013. [doi]
Abstract is missing.