A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors

J.-M. Huang, A. Q. Liu, X. M. Zhang, J. Ahn. A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors. International Journal of Computational Engineering Science, 4(3):569-572, 2003. [doi]

@article{HuangLZA03,
  title = {A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors},
  author = {J.-M. Huang and A. Q. Liu and X. M. Zhang and J. Ahn},
  year = {2003},
  doi = {10.1142/S1465876303001770},
  url = {http://dx.doi.org/10.1142/S1465876303001770},
  tags = {systematic-approach},
  researchr = {https://researchr.org/publication/HuangLZA03},
  cites = {0},
  citedby = {0},
  journal = {International Journal of Computational Engineering Science},
  volume = {4},
  number = {3},
  pages = {569-572},
}