A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors

J.-M. Huang, A. Q. Liu, X. M. Zhang, J. Ahn. A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors. International Journal of Computational Engineering Science, 4(3):569-572, 2003. [doi]

Abstract

Abstract is missing.