A novel approach to regression test selection for J2EE applications

Sheng Huang, Zhong Jie Li, Jun Zhu, Yanghua Xiao, Wei Wang 0009. A novel approach to regression test selection for J2EE applications. In IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011. pages 13-22, IEEE, 2011. [doi]

Authors

Sheng Huang

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Zhong Jie Li

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Jun Zhu

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Yanghua Xiao

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Wei Wang 0009

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