A novel approach to regression test selection for J2EE applications

Sheng Huang, Zhong Jie Li, Jun Zhu, Yanghua Xiao, Wei Wang 0009. A novel approach to regression test selection for J2EE applications. In IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011. pages 13-22, IEEE, 2011. [doi]

@inproceedings{HuangLZXW11,
  title = {A novel approach to regression test selection for J2EE applications},
  author = {Sheng Huang and Zhong Jie Li and Jun Zhu and Yanghua Xiao and Wei Wang 0009},
  year = {2011},
  doi = {10.1109/ICSM.2011.6080768},
  url = {http://dx.doi.org/10.1109/ICSM.2011.6080768},
  researchr = {https://researchr.org/publication/HuangLZXW11},
  cites = {0},
  citedby = {0},
  pages = {13-22},
  booktitle = {IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-0663-9},
}