Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences - researchr publication authors

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Xiaoshui Huang, Guofeng Mei, Jian Zhang 0002. Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 11363-11371, IEEE, 2020. [doi]

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