Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences

Xiaoshui Huang, Guofeng Mei, Jian Zhang 0002. Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 11363-11371, IEEE, 2020. [doi]

@inproceedings{HuangM020,
  title = {Feature-Metric Registration: A Fast Semi-Supervised Approach for Robust Point Cloud Registration Without Correspondences},
  author = {Xiaoshui Huang and Guofeng Mei and Jian Zhang 0002},
  year = {2020},
  doi = {10.1109/CVPR42600.2020.01138},
  url = {https://doi.org/10.1109/CVPR42600.2020.01138},
  researchr = {https://researchr.org/publication/HuangM020},
  cites = {0},
  citedby = {0},
  pages = {11363-11371},
  booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-7168-5},
}