Baicheng Huang, Xinyi Pan, Haiwei Chai, Feng Zhu, Dong Liu, Xiaoyong Pan. High Sample Rate Audio Generation Using Neural Large Language Models for Mitigating Device Manufacturing Defects. In IEEE International Conference on Consumer Electronics, ICCE 2026, Dubai, United Arab Emirates, February 3-5, 2026. pages 1-4, IEEE, 2026. [doi]
Abstract is missing.