Test Methodology for Dual-rail Asynchronous Circuits

Kuan-Yen Huang, Ting-Yu Shen, Chien-Mo Li. Test Methodology for Dual-rail Asynchronous Circuits. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]

@inproceedings{HuangSL17-4,
  title = {Test Methodology for Dual-rail Asynchronous Circuits},
  author = {Kuan-Yen Huang and Ting-Yu Shen and Chien-Mo Li},
  year = {2017},
  doi = {10.1145/3061639.3062325},
  url = {http://doi.acm.org/10.1145/3061639.3062325},
  researchr = {https://researchr.org/publication/HuangSL17-4},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017},
  publisher = {ACM},
  isbn = {978-1-4503-4927-7},
}