Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir. Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 295-298, IEEE Computer Society, 2010. [doi]
@inproceedings{HuangSM10-0,
title = {Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation},
author = {Ke Huang and Haralampos-G. D. Stratigopoulos and Salvador Mir},
year = {2010},
doi = {10.1109/ATS.2010.57},
url = {http://dx.doi.org/10.1109/ATS.2010.57},
researchr = {https://researchr.org/publication/HuangSM10-0},
cites = {0},
citedby = {0},
pages = {295-298},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}