Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir. Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 295-298, IEEE Computer Society, 2010. [doi]
Abstract is missing.