Coverage-Guided Testing for Recurrent Neural Networks

Wei Huang, Youcheng Sun, Xingyu Zhao 0001, James Sharp, Wenjie Ruan, Jie Meng, Xiaowei Huang 0001. Coverage-Guided Testing for Recurrent Neural Networks. IEEE Transactions on Reliability, 71(3):1191-1206, 2022. [doi]

Authors

Wei Huang

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Youcheng Sun

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Xingyu Zhao 0001

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James Sharp

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Wenjie Ruan

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Jie Meng

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Xiaowei Huang 0001

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