Coverage-Guided Testing for Recurrent Neural Networks

Wei Huang, Youcheng Sun, Xingyu Zhao 0001, James Sharp, Wenjie Ruan, Jie Meng, Xiaowei Huang 0001. Coverage-Guided Testing for Recurrent Neural Networks. IEEE Transactions on Reliability, 71(3):1191-1206, 2022. [doi]

Abstract

Abstract is missing.