Nen-Fu Huang, Wen-Yen Tsai. SHOCK: A Worst-Case Ensured Sub-Linear Time Pattern Matching Algorithm for Inline Anti-Virus Scanning. In Proceedings of IEEE International Conference on Communications, ICC 2010, Cape Town, South Africa, 23-27 May 2010. pages 1-5, IEEE, 2010. [doi]
@inproceedings{HuangT10-10,
title = {SHOCK: A Worst-Case Ensured Sub-Linear Time Pattern Matching Algorithm for Inline Anti-Virus Scanning},
author = {Nen-Fu Huang and Wen-Yen Tsai},
year = {2010},
doi = {10.1109/ICC.2010.5501986},
url = {http://dx.doi.org/10.1109/ICC.2010.5501986},
researchr = {https://researchr.org/publication/HuangT10-10},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {Proceedings of IEEE International Conference on Communications, ICC 2010, Cape Town, South Africa, 23-27 May 2010},
publisher = {IEEE},
isbn = {978-1-4244-6402-9},
}