SHOCK: A Worst-Case Ensured Sub-Linear Time Pattern Matching Algorithm for Inline Anti-Virus Scanning

Nen-Fu Huang, Wen-Yen Tsai. SHOCK: A Worst-Case Ensured Sub-Linear Time Pattern Matching Algorithm for Inline Anti-Virus Scanning. In Proceedings of IEEE International Conference on Communications, ICC 2010, Cape Town, South Africa, 23-27 May 2010. pages 1-5, IEEE, 2010. [doi]

Abstract

Abstract is missing.