Development of a large scanning-range atomic force microscope with adaptive complementary sliding mode controller

Kuan-Chia Huang, Jim-Wei Wu, Jyun-Jhih Chen, Chih-Lieh Chen, Mei-Yung Chen, Li-Chen Fu. Development of a large scanning-range atomic force microscope with adaptive complementary sliding mode controller. In Proceedings of the 51th IEEE Conference on Decision and Control, CDC 2012, December 10-13, 2012, Maui, HI, USA. pages 1685-1690, IEEE, 2012. [doi]

@inproceedings{HuangWCCCF12,
  title = {Development of a large scanning-range atomic force microscope with adaptive complementary sliding mode controller},
  author = {Kuan-Chia Huang and Jim-Wei Wu and Jyun-Jhih Chen and Chih-Lieh Chen and Mei-Yung Chen and Li-Chen Fu},
  year = {2012},
  doi = {10.1109/CDC.2012.6426057},
  url = {http://dx.doi.org/10.1109/CDC.2012.6426057},
  researchr = {https://researchr.org/publication/HuangWCCCF12},
  cites = {0},
  citedby = {0},
  pages = {1685-1690},
  booktitle = {Proceedings of the 51th IEEE Conference on Decision and Control, CDC 2012, December 10-13, 2012, Maui, HI, USA},
  publisher = {IEEE},
  isbn = {978-1-4673-2065-8},
}