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Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET s (n-DTMOSFET) measured by gated-diode configuration

Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang. Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET s (n-DTMOSFET) measured by gated-diode configuration. Microelectronics Reliability, 43(5):707-711, 2003. [doi]

Authors

Ru Huang

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Jinyan Wang

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Jin He

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Min Yu

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Xing Zhang

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Yangyuan Wang

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