Image Processing Techniques for Wafer Defect Cluster Identification

Chenn-Jung Huang, Chua-Chin Wang, Chi-Feng Wu. Image Processing Techniques for Wafer Defect Cluster Identification. IEEE Design & Test of Computers, 19(2):44-48, 2002. [doi]

Authors

Chenn-Jung Huang

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Chua-Chin Wang

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Chi-Feng Wu

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