Research and Application of Hausdorff Metric Based i-v Vague Clustering Method - researchr publication authors

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M. Huang, Z. X. Xia, Q. H. Zeng. Research and Application of Hausdorff Metric Based i-v Vague Clustering Method. In Second International Conference on Digital Manufacturing and Automation, ICDMA 2011, Zhangjiajie, Hunan, China, August 5-7, 2011. pages 900-905, IEEE, 2011. [doi]

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