Resistant learning on the envelope bulk for identifying anomalous patterns

Shin-Ying Huang, Fang Yu, Rua-Huan Tsaih, Yennun Huang. Resistant learning on the envelope bulk for identifying anomalous patterns. In 2014 International Joint Conference on Neural Networks, IJCNN 2014, Beijing, China, July 6-11, 2014. pages 3303-3310, IEEE, 2014. [doi]

Authors

Shin-Ying Huang

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Fang Yu

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Rua-Huan Tsaih

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Yennun Huang

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