Shin-Ying Huang, Fang Yu, Rua-Huan Tsaih, Yennun Huang. Resistant learning on the envelope bulk for identifying anomalous patterns. In 2014 International Joint Conference on Neural Networks, IJCNN 2014, Beijing, China, July 6-11, 2014. pages 3303-3310, IEEE, 2014. [doi]
No references recorded for this publication.
No citations of this publication recorded.