Zheng-Liang Huang, Fa-Xin Yu, Shu-Ting Zhang, Hao Luo, Ping-Hui Wang, Yao Zheng. Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data. IEICE Transactions, 92-A(9):2376-2379, 2009. [doi]
@article{HuangYZLWZ09,
title = {Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data},
author = {Zheng-Liang Huang and Fa-Xin Yu and Shu-Ting Zhang and Hao Luo and Ping-Hui Wang and Yao Zheng},
year = {2009},
url = {http://search.ieice.org/bin/summary.php?id=e92-a_9_2376},
tags = {empirical, testing, analysis, data-flow, data-flow analysis},
researchr = {https://researchr.org/publication/HuangYZLWZ09},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {92-A},
number = {9},
pages = {2376-2379},
}