Shi-Yu Huang, Chih-Chieh Zheng. Die-to-Die Clock Skew Characterization and Tuning for 2.5D ICs. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 221-226, IEEE Computer Society, 2016. [doi]
@inproceedings{HuangZ16-13,
title = {Die-to-Die Clock Skew Characterization and Tuning for 2.5D ICs},
author = {Shi-Yu Huang and Chih-Chieh Zheng},
year = {2016},
doi = {10.1109/ATS.2016.11},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.11},
researchr = {https://researchr.org/publication/HuangZ16-13},
cites = {0},
citedby = {0},
pages = {221-226},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}