From BTI variability to product failure rate: A technology scaling perspective

V. Huard, D. Angot, F. Cacho. From BTI variability to product failure rate: A technology scaling perspective. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]

Abstract

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