E. Huber, M. Mirzaee, J. Bjorgaard, M. Hoyack, S. Noghanian, I. Chang. Dielectric property measurement of PLA. In 2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, ND, USA, May 19-21, 2016. pages 788-792, IEEE, 2016. [doi]
@inproceedings{HuberMBHNC16,
title = {Dielectric property measurement of PLA},
author = {E. Huber and M. Mirzaee and J. Bjorgaard and M. Hoyack and S. Noghanian and I. Chang},
year = {2016},
doi = {10.1109/EIT.2016.7535340},
url = {http://dx.doi.org/10.1109/EIT.2016.7535340},
researchr = {https://researchr.org/publication/HuberMBHNC16},
cites = {0},
citedby = {0},
pages = {788-792},
booktitle = {2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, ND, USA, May 19-21, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9985-2},
}