Karl Fred Huemmrich, Lawrence A. Corp, Andrew L. Russ, Elizabeth M. Middleton, William P. Kustas, John Prueger, Yen-Ben Cheng. Using Reflectance Measurements to Determine Light use Efficiency in Corn. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 632-634, IEEE, 2008. [doi]
Abstract is missing.