William J. Hughes III. System-Level Boundary-Scan in a Highly Integrated Switch. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 636-639, IEEE Computer Society, 1997.
@inproceedings{Hughes97:3,
title = {System-Level Boundary-Scan in a Highly Integrated Switch},
author = {William J. Hughes III},
year = {1997},
researchr = {https://researchr.org/publication/Hughes97%3A3},
cites = {0},
citedby = {0},
pages = {636-639},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}